Alyabyeva, Natalia ORCID: 0000-0001-5999-5821, Ouvrard, Aimeric ORCID: 0000-0003-3652-1222, Lindfors-Vrejoiu, Ionela, Kolomiytsev, Alexey ORCID: 0000-0001-7483-0240, Solodovnik, Maxim ORCID: 0000-0002-0557-5909, Ageev, Oleg and McGrouther, Damien (2018). Modified cantilevers to probe unambiguously out-of-plane piezoresponse. Phys. Rev. Mater., 2 (6). COLLEGE PK: AMER PHYSICAL SOC. ISSN 2475-9953

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Abstract

We demonstrate and investigate the coupling of contributions from both in-plane (IP) polarization and out-of-plane (OP) components in BiFeO3 (BFO) thin-film polarization probed by piezoresponse force microscopy (PFM). Such coupling leads to image artifacts which prevent the correct determination of OP polarization vector directions and the corresponding piezoelectric coefficient d(33). Using material strength theory with a one-dimensional modeling of the cantilever oscillation amplitude under electrostatic and elastic forces as a function of the tip length, we have evidenced the impact of IP piezoresponse to the OP signal for tip length longer than 4 mu m. The IP polarization vector induces a significant longitudinal bending of the cantilever, due to the small spring constant of long tips, which provokes a normal deviation superimposed to the OP piezoresponse. These artifacts can be reduced by increasing the longitudinal spring constant of the cantilever by shortening the tip length. Standard cantilevers with 15-mu m-long tips were modified to reach the desired tip length, using focused ion-beam techniques and tested using PFM on the same BFO thin film. Tip length shortening has strongly reduced IP artifacts as expected, while the impact of nonlocal electrostatic forces, becoming predominant for tips shorter than 1 mu m, has led to a non-negligible deflection offset. For shorter tips, a strong electric field from a cantilever beam can induce polarization switching as observed for a 0.5-mu m-long tip. Tip length ranging from 1 to 4 mu m allowed minimizing both artifacts to probe unambiguously OP piezoresponse and quantify the d(33) piezoelectric coefficient.

Item Type: Journal Article
Creators:
CreatorsEmailORCIDORCID Put Code
Alyabyeva, NataliaUNSPECIFIEDorcid.org/0000-0001-5999-5821UNSPECIFIED
Ouvrard, AimericUNSPECIFIEDorcid.org/0000-0003-3652-1222UNSPECIFIED
Lindfors-Vrejoiu, IonelaUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Kolomiytsev, AlexeyUNSPECIFIEDorcid.org/0000-0001-7483-0240UNSPECIFIED
Solodovnik, MaximUNSPECIFIEDorcid.org/0000-0002-0557-5909UNSPECIFIED
Ageev, OlegUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
McGrouther, DamienUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
URN: urn:nbn:de:hbz:38-183066
DOI: 10.1103/PhysRevMaterials.2.064402
Journal or Publication Title: Phys. Rev. Mater.
Volume: 2
Number: 6
Date: 2018
Publisher: AMER PHYSICAL SOC
Place of Publication: COLLEGE PK
ISSN: 2475-9953
Language: English
Faculty: Unspecified
Divisions: Unspecified
Subjects: no entry
Uncontrolled Keywords:
KeywordsLanguage
FORCE MICROSCOPY; FILMSMultiple languages
Materials Science, MultidisciplinaryMultiple languages
Refereed: Yes
URI: http://kups.ub.uni-koeln.de/id/eprint/18306

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