Kwon, Owoong, Seol, Daehee, Lee, Dongkyu, Han, Hee, Lindfors-Vrejoiu, Ionela, Lee, Woo, Jesse, Stephen, Lee, Ho Nyung ORCID: 0000-0002-2180-3975, Kalinin, Sergei V., Alexe, Marin ORCID: 0000-0002-0386-3026 and Kim, Yunseok (2018). Direct Probing of Polarization Charge at Nanoscale Level. Adv. Mater., 30 (1). WEINHEIM: WILEY-V C H VERLAG GMBH. ISSN 1521-4095

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Abstract

Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long-term development of reducing the sizes of devices, the preparation of ferroelectric materials and devices is entering the nanometer-scale regime. Accordingly, to evaluate the ferroelectricity, there is a need to investigate the polarization charge at the nanoscale. Nonetheless, it is generally accepted that the detection of polarization charges using a conventional conductive atomic force microscopy (CAFM) without a top electrode is not feasible because the nanometer-scale radius of an atomic force microscopy (AFM) tip yields a very low signal-to-noise ratio. However, the detection is unrelated to the radius of an AFM tip and, in fact, a matter of the switched area. In this work, the direct probing of the polarization charge at the nanoscale is demonstrated using the positive-up-negative-down method based on the conventional CAFM approach without additional corrections or circuits to reduce the parasitic capacitance. The polarization charge densities of 73.7 and 119.0 mu C cm(-2) are successfully probed in ferroelectric nanocapacitors and thin films, respectively. The obtained results show the feasibility of the evaluation of polarization charge at the nanoscale and provide a new guideline for evaluating the ferroelectricity at the nanoscale.

Item Type: Journal Article
Creators:
CreatorsEmailORCIDORCID Put Code
Kwon, OwoongUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Seol, DaeheeUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lee, DongkyuUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Han, HeeUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lindfors-Vrejoiu, IonelaUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lee, WooUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Jesse, StephenUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lee, Ho NyungUNSPECIFIEDorcid.org/0000-0002-2180-3975UNSPECIFIED
Kalinin, Sergei V.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Alexe, MarinUNSPECIFIEDorcid.org/0000-0002-0386-3026UNSPECIFIED
Kim, YunseokUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
URN: urn:nbn:de:hbz:38-199159
DOI: 10.1002/adma.201703675
Journal or Publication Title: Adv. Mater.
Volume: 30
Number: 1
Date: 2018
Publisher: WILEY-V C H VERLAG GMBH
Place of Publication: WEINHEIM
ISSN: 1521-4095
Language: English
Faculty: Unspecified
Divisions: Unspecified
Subjects: no entry
Uncontrolled Keywords:
KeywordsLanguage
FREQUENCY-DEPENDENCE; COERCIVE FIELD; HYSTERESIS; FERROELECTRICITY; CAPACITORS; TITANATE; FILMSMultiple languages
Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed MatterMultiple languages
Refereed: Yes
URI: http://kups.ub.uni-koeln.de/id/eprint/19915

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