Universität zu Köln

Sundermann, M., Strigari, F., Willers, T., Weinen, J., Liao, Y. F., Tsuei, K. -D., Hiraoka, N., Ishii, H., Yamaoka, H., Mizuki, J., Zekko, Y., Bauer, E. D., Sarrao, J. L., Thompson, J. D., Lejay, P., Muro, Y., Yutani, K., Takabatake, T., Tanaka, A., Hollmann, N., Tjeng, L. H. and Severing, A. (2016). Quantitative study of the f occupation in CeMIn5 and other cerium compounds with hard X-rays. J. Electron Spectrosc. Relat. Phenom., 209. S. 1 - 9. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1873-2526

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Abstract

We present bulk-sensitive hard X-ray photoelectron spectroscopy (HAXPES) data of the Ce3d core levels and lifetime-reduced L-edge X-ray absorption spectroscopy (XAS) in the partial fluorescence yield (PFY) mode of the CeMIn5 family with M=Co, Rh, and Ir. The HAXPES data are analyzed quantitatively with a combination of full multiplet and configuration interaction model which allows correcting for the strong plasmons in the CeMIn5 HAXPES data, and reliable weights w(n) of the different f(n) contributions in the ground state are determined. The CeMIn5 results are compared to HAXPES data of other heavy fermion compounds and a systematic decrease of the hybridization strength V-eff from CePd3 to CeRh3B2 to CeRu2Si2 is observed, while it is smallest for the three CeMIn5 compounds. The f-occupation, however, increases in the same sequence and is close to one for the CeMIn5 family. The PFY-XAS data confirm an identical f-occupation in the three CeMIn5 compounds and a phenomenological fit to these PFY-XAS data combined with a configuration interaction model yields consistent results. (C) 2016 The Authors. Published by Elsevier B.V.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Sundermann, M. UNSPECIFIED UNSPECIFIED UNSPECIFIED Strigari, F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Willers, T. UNSPECIFIED UNSPECIFIED UNSPECIFIED Weinen, J. UNSPECIFIED UNSPECIFIED UNSPECIFIED Liao, Y. F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tsuei, K. -D. UNSPECIFIED UNSPECIFIED UNSPECIFIED Hiraoka, N. UNSPECIFIED UNSPECIFIED UNSPECIFIED Ishii, H. UNSPECIFIED UNSPECIFIED UNSPECIFIED Yamaoka, H. UNSPECIFIED UNSPECIFIED UNSPECIFIED Mizuki, J. UNSPECIFIED UNSPECIFIED UNSPECIFIED Zekko, Y. UNSPECIFIED UNSPECIFIED UNSPECIFIED Bauer, E. D. UNSPECIFIED UNSPECIFIED UNSPECIFIED Sarrao, J. L. UNSPECIFIED UNSPECIFIED UNSPECIFIED Thompson, J. D. UNSPECIFIED UNSPECIFIED UNSPECIFIED Lejay, P. UNSPECIFIED UNSPECIFIED UNSPECIFIED Muro, Y. UNSPECIFIED UNSPECIFIED UNSPECIFIED Yutani, K. UNSPECIFIED UNSPECIFIED UNSPECIFIED Takabatake, T. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tanaka, A. UNSPECIFIED UNSPECIFIED UNSPECIFIED Hollmann, N. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tjeng, L. H. UNSPECIFIED UNSPECIFIED UNSPECIFIED Severing, A. UNSPECIFIED UNSPECIFIED UNSPECIFIED
URN:	urn:nbn:de:hbz:38-276630
DOI:	10.1016/j.elspec.2016.02.002
Journal or Publication Title:	J. Electron Spectrosc. Relat. Phenom.
Volume:	209
Page Range:	S. 1 - 9
Date:	2016
Publisher:	ELSEVIER SCIENCE BV
Place of Publication:	AMSTERDAM
ISSN:	1873-2526
Language:	English
Faculty:	Unspecified
Divisions:	Unspecified
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language FERMION SUPERCONDUCTOR CEIRIN5; SURFACE ELECTRONIC-STRUCTURE; QUANTUM CRITICALITY; CE; PHOTOEMISSION; VALENCE; SPECTROSCOPY; SCATTERING; SPECTRA; CEPD3 Multiple languages Spectroscopy Multiple languages
Refereed:	Yes
URI:	http://kups.ub.uni-koeln.de/id/eprint/27663