Universität zu Köln

Mendling, Jan, Recker, Jan C. ORCID: 0000-0002-2072-5792, van der Aalst, Wil M. and Rosemann, Michael (2006). Generating correct EPCs from configured C-EPCs. In: Applied computing 2006 : the 21st Annual ACM Symposium on Applied Computing; proceedings of the 2006 ACM Symposium on Applied Computing, Dijon, France, April 23 - 27, 2006, pp. 1505-1510. New York, NY: Association for Computing Machinery. ISBN 1595931082

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Abstract

Process reference models play an important role for the alignment and configuration of commercial off-the-shelf Enterprise Systems to requirements of an organization. Recently, Configurable Event-driven Process Chains (C-EPCs) have been proposed as a language to support the model-driven configuration of such Enterprise Systems. While some problems of generating correct EPCs from a configured C-EPC have been discussed, up to now there is no implementation of an algorithm available to automate the configuration task. This paper presents a configuration algorithm that is guided by a minimality criterion. It details and extends a previous algorithm that has only been sketched so far. As a proof-of-concept the algorithm has been implemented.

Item Type:	Book Section, Proceedings Item or annotation in a legal commentary
Creators:	Creators Email ORCID Mendling, Jan UNSPECIFIED UNSPECIFIED Recker, Jan C. UNSPECIFIED orcid.org/0000-0002-2072-5792 van der Aalst, Wil M. UNSPECIFIED UNSPECIFIED Rosemann, Michael UNSPECIFIED UNSPECIFIED
Additional Information:	For more information, please refer to the journal's website (see hypertext link) or contact the author.
URN:	urn:nbn:de:hbz:38-89566
DOI:	10.1145/1141277.1141629
Publisher:	Association for Computing Machinery
ISBN:	1595931082
Subjects:	Data processing Computer science Management and auxiliary services
Faculty:	Faculty of Management, Economy and Social Sciences
Divisions:	Weitere Institute, Arbeits- und Forschungsgruppen > Cologne Institute for Information Systems (CIIS)
Language:	English
Date:	2006
Place of Publication:	New York, NY
Refereed:	Yes
Page Range:	pp. 1505-1510
Number of Pages:	1000
Title of Book:	Applied computing 2006 : the 21st Annual ACM Symposium on Applied Computing; proceedings of the 2006 ACM Symposium on Applied Computing, Dijon, France, April 23 - 27, 2006
URI:	http://kups.ub.uni-koeln.de/id/eprint/8956