Meunier, V., Löhnert, U. ORCID: 0000-0002-9023-0269, Kollias, P. and Crewell, S. ORCID: 0000-0003-1251-5805 (2013). Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers. Atmospheric Measurement Techniques, 6 (5). pp. 1171-1187. European Geosciences Union. ISSN 1867-8548

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Identification Number:10.5194/amt-6-1171-2013

Item Type: Article
Creators:
Creators
Email
ORCID
ORCID Put Code
Meunier, V.
UNSPECIFIED
UNSPECIFIED
UNSPECIFIED
Löhnert, U.
UNSPECIFIED
https://orcid.org/0000-0002-9023-0269
UNSPECIFIED
Kollias, P.
UNSPECIFIED
UNSPECIFIED
UNSPECIFIED
Crewell, S.
UNSPECIFIED
https://orcid.org/0000-0003-1251-5805
UNSPECIFIED
URN: urn:nbn:de:hbz:38-114985
Identification Number: 10.5194/amt-6-1171-2013
Journal or Publication Title: Atmospheric Measurement Techniques
Volume: 6
Number: 5
Page Range: pp. 1171-1187
Date: 2013
Publisher: European Geosciences Union
ISSN: 1867-8548
Language: English
Faculty: Faculty of Mathematics and Natural Sciences
Divisions: Faculty of Mathematics and Natural Sciences > Department of Geosciences > Institute for Geophysics and Meteorology
Subjects: Earth sciences
Refereed: Yes
URI: http://kups.ub.uni-koeln.de/id/eprint/11498

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