Universität zu Köln

Schaefer, Benjamin, Matthiae, Moritz, Zhang, Xiaozhu ORCID: 0000-0003-3816-1478, Rohden, Martin, Timme, Marc ORCID: 0000-0002-5956-3137 and Witthaut, Dirk ORCID: 0000-0002-3623-5341 (2017). Escape routes, weak links, and desynchronization in fluctuation-driven networks. Phys. Rev. E, 95 (6). COLLEGE PK: AMER PHYSICAL SOC. ISSN 2470-0053

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Abstract

Shifting our electricity generation from fossil fuel to renewable energy sources introduces large fluctuations to the power system. Here, we demonstrate how increased fluctuations, reduced damping, and reduced intertia may undermine the dynamical robustness of power grid networks. Focusing on fundamental noise models, we derive analytic insights into which factors limit the dynamic robustness and how fluctuations may induce a system escape from an operating state. Moreover, we identify weak links in the grid that make it particularly vulnerable to fluctuations. These results thereby not only contribute to a theoretical understanding of how fluctuations act on distributed network dynamics, they may also help designing future renewable energy systems to be more robust.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Schaefer, Benjamin UNSPECIFIED UNSPECIFIED UNSPECIFIED Matthiae, Moritz UNSPECIFIED UNSPECIFIED UNSPECIFIED Zhang, Xiaozhu UNSPECIFIED orcid.org/0000-0003-3816-1478 UNSPECIFIED Rohden, Martin UNSPECIFIED UNSPECIFIED UNSPECIFIED Timme, Marc UNSPECIFIED orcid.org/0000-0002-5956-3137 UNSPECIFIED Witthaut, Dirk UNSPECIFIED orcid.org/0000-0002-3623-5341 UNSPECIFIED
URN:	urn:nbn:de:hbz:38-227852
DOI:	10.1103/PhysRevE.95.060203
Journal or Publication Title:	Phys. Rev. E
Volume:	95
Number:	6
Date:	2017
Publisher:	AMER PHYSICAL SOC
Place of Publication:	COLLEGE PK
ISSN:	2470-0053
Language:	English
Faculty:	Unspecified
Divisions:	Unspecified
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language POWER-SYSTEM STABILITY; ENERGY; MODEL Multiple languages Physics, Fluids & Plasmas; Physics, Mathematical Multiple languages
Refereed:	Yes
URI:	http://kups.ub.uni-koeln.de/id/eprint/22785