Universität zu Köln

Kaya, L., Vogt, A., Reiter, P., Birkenbach, B., Hirsch, R., Arnswald, K., Hess, H., Seidlitz, M., Steinbach, T., Warr, N., Wolf, K., Stahl, C., Pietralla, N., Limboeck, T., Meerholz, K. and Lutter, R. (2017). Characterization and calibration of radiation-damaged double-sided silicon strip detectors. Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc. Equip., 855. S. 109 - 118. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1872-9576

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Abstract

Double-sided silicon strip detectors (DSSSD) are commonly used for event-by-event identification of charged particles as well as the reconstruction of particle trajectories in nuclear physics experiments with stable and radioactive beams. Intersecting areas of both p- and n-doped front- and back-side segments form individual virtual pixel segments allowing for a high detector granularity. DSSSDs are employed in demanding experimental environments and have to withstand high count rates of impinging nuclei. The illumination of the detector is often not homogeneous. Consequently, radiation damage of the detector is distributed non uniformly. Position-dependent incomplete charge collection due to radiation damage limits the performance and lifetime of the detectors, the response of different channels may vary drastically. Position-resolved charge collection losses between front- and back-side segments are investigated in an in-beam experiment and by performing radioactive source measurements. A novel position-resolved calibration method based on mutual consistency of p-side and n-side charges yields a significant enhancement of the energy resolution and the performance of radiation-damaged parts of the detector.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Kaya, L. UNSPECIFIED UNSPECIFIED UNSPECIFIED Vogt, A. UNSPECIFIED UNSPECIFIED UNSPECIFIED Reiter, P. UNSPECIFIED UNSPECIFIED UNSPECIFIED Birkenbach, B. UNSPECIFIED UNSPECIFIED UNSPECIFIED Hirsch, R. UNSPECIFIED UNSPECIFIED UNSPECIFIED Arnswald, K. UNSPECIFIED UNSPECIFIED UNSPECIFIED Hess, H. UNSPECIFIED UNSPECIFIED UNSPECIFIED Seidlitz, M. UNSPECIFIED UNSPECIFIED UNSPECIFIED Steinbach, T. UNSPECIFIED UNSPECIFIED UNSPECIFIED Warr, N. UNSPECIFIED UNSPECIFIED UNSPECIFIED Wolf, K. UNSPECIFIED UNSPECIFIED UNSPECIFIED Stahl, C. UNSPECIFIED UNSPECIFIED UNSPECIFIED Pietralla, N. UNSPECIFIED UNSPECIFIED UNSPECIFIED Limboeck, T. UNSPECIFIED UNSPECIFIED UNSPECIFIED Meerholz, K. UNSPECIFIED UNSPECIFIED UNSPECIFIED Lutter, R. UNSPECIFIED UNSPECIFIED UNSPECIFIED
URN:	urn:nbn:de:hbz:38-230817
DOI:	10.1016/j.nima.2017.02.006
Journal or Publication Title:	Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc. Equip.
Volume:	855
Page Range:	S. 109 - 118
Date:	2017
Publisher:	ELSEVIER SCIENCE BV
Place of Publication:	AMSTERDAM
ISSN:	1872-9576
Language:	English
Faculty:	Unspecified
Divisions:	Unspecified
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language BEAM; IRRADIATION; SYSTEM; GAP Multiple languages Instruments & Instrumentation; Nuclear Science & Technology; Physics, Nuclear; Physics, Particles & Fields Multiple languages
Refereed:	Yes
URI:	http://kups.ub.uni-koeln.de/id/eprint/23081