Universität zu Köln

Olthof, Selina ORCID: 0000-0002-8871-1549 (2020). Tracking energy levels - Photoelectron spectroscopy helps in finding novel semiconductor materials. Vak. Forsch. Prax., 32 (1). S. 32 - 37. WEINHEIM: WILEY-V C H VERLAG GMBH. ISSN 1522-2454

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Abstract

Tracking energy levels - Photoelectron spectroscopy helps in finding novel semiconductor materials Research on novel semiconducting materials keeps attracting considerable interest due to the potential to develop more cost effective processing compared to conventional inorganic technology. Maybe more importantly, novel device concept become possible such as flexible or semitransparent displays and solar cells. Two of the most promising candidates are introduced here: organic semiconductors as well as halide perovskites. In both material classes, it is possible to tune the absorption or emission properties over a wide range by adjusting the structure or composition or the material. In order to effectively integrate these materials in devices, it is necessary to understand their fundamental properties. Here, the vacuum based photoelectron spectroscopy plays an important role, due to the possibility to directly map the electronic structure of the semiconducting or adjacent layers, which in turn determines the charge transport throughout the device.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Olthof, Selina UNSPECIFIED orcid.org/0000-0002-8871-1549 UNSPECIFIED
URN:	urn:nbn:de:hbz:38-346387
DOI:	10.1002/vipr.202000732
Journal or Publication Title:	Vak. Forsch. Prax.
Volume:	32
Number:	1
Page Range:	S. 32 - 37
Date:	2020
Publisher:	WILEY-V C H VERLAG GMBH
Place of Publication:	WEINHEIM
ISSN:	1522-2454
Language:	German
Faculty:	Faculty of Mathematics and Natural Sciences
Divisions:	Faculty of Mathematics and Natural Sciences > Department of Chemistry > Institute of Physical Chemistry
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language Engineering, Mechanical Multiple languages
Refereed:	Yes
URI:	http://kups.ub.uni-koeln.de/id/eprint/34638