Universität zu Köln

Strigari, F., Sundermann, M., Muro, Y., Yutani, K., Takabatake, T., Tsuei, K. -D., Liao, Y. F., Tanaka, A., Thalmeier, P., Haverkort, M. W., Tjeng, L. H. and Severing, A. (2015). Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (M = Ru, Os and Fe) by means of bulk-sensitive hard X-ray photoelectron spectroscopy. J. Electron Spectrosc. Relat. Phenom., 199. S. 56 - 64. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1873-2526

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Abstract

The occupancy of the 4f(n) contributions in the Kondo semiconductors CeM2Al10 (M = Ru, Os and Fe) has been quantitatively determined by means of bulk-sensitive hard X-ray photoelectron spectroscopy (HAXPES) on the Ce 3d core levels. Combining a configuration interaction scheme with full multiplet calculations allowed to accurately describe the HAXPES data despite the presence of strong plasmon excitations in the spectra. The configuration interaction parameters obtained from this analysis - in particular the hybridization strength V-eff and the effective f binding energy Delta(f) - indicate a slightly stronger exchange interaction in CeOs2Al10 compared to CeRu2Al10, and a significant increase in CeFe2Al10. This shows the existence of a substantial amount of Kondo screening in these magnetically ordered systems and places the entire CeM2Al10 family in the region of strong exchange interactions. (C) 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Strigari, F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Sundermann, M. UNSPECIFIED UNSPECIFIED UNSPECIFIED Muro, Y. UNSPECIFIED UNSPECIFIED UNSPECIFIED Yutani, K. UNSPECIFIED UNSPECIFIED UNSPECIFIED Takabatake, T. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tsuei, K. -D. UNSPECIFIED UNSPECIFIED UNSPECIFIED Liao, Y. F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tanaka, A. UNSPECIFIED UNSPECIFIED UNSPECIFIED Thalmeier, P. UNSPECIFIED UNSPECIFIED UNSPECIFIED Haverkort, M. W. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tjeng, L. H. UNSPECIFIED UNSPECIFIED UNSPECIFIED Severing, A. UNSPECIFIED UNSPECIFIED UNSPECIFIED
URN:	urn:nbn:de:hbz:38-412979
DOI:	10.1016/j.elspec.2015.01.004
Journal or Publication Title:	J. Electron Spectrosc. Relat. Phenom.
Volume:	199
Page Range:	S. 56 - 64
Date:	2015
Publisher:	ELSEVIER SCIENCE BV
Place of Publication:	AMSTERDAM
ISSN:	1873-2526
Language:	English
Faculty:	Unspecified
Divisions:	Unspecified
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language ELECTRONIC-STRUCTURE; CE COMPOUNDS; PHOTOEMISSION; MODEL; STATES; RESONANCE; SYSTEMS; LATTICE Multiple languages Spectroscopy Multiple languages
URI:	http://kups.ub.uni-koeln.de/id/eprint/41297