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Journal Article

Krause, J., Dickel, C., Vaal, E., Vielmetter, M., Feng, J., Bounds, R., Catelani, G., Fink, J. M. and Ando, Yoichi ORCID: 0000-0002-3553-3355 (2022). Magnetic Field Resilience of Three-Dimensional Transmons with Thin-Film Al/AlOx/Al Josephson Junctions Approaching 1 T. Phys. Rev. Appl., 17 (3). COLLEGE PK: AMER PHYSICAL SOC. ISSN 2331-7019

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