Stein, Simon (2004). Barrier and interface properties of magnetic tunneling junctions studied via electrical transport. [Thesis Abstract]

[img]
Preview
PDF
Deutsche_Zusammenfassung_Simon_Stein.pdf

Download (59kB)
[img]
Preview
PDF
Englisches_Abstract_Simon_Stein.pdf

Download (59kB)

Item Type: Thesis Abstract
Creators:
CreatorsEmailORCID
Stein, Simonsimon.stein@gmx.netUNSPECIFIED
URN: urn:nbn:de:hbz:38-10934
Subjects: Physics
Uncontrolled Keywords:
KeywordsLanguage
Magnetisch , Dünnschichten , Tunneln , TMR , TransportmessungenGerman
magnetic , thin films , tunneling , TMR , transport measurementsEnglish
Faculty: Faculty of Mathematics and Natural Sciences
Divisions: Faculty of Mathematics and Natural Sciences > Institute of Physics II
Language: English
Date: 2004
Full Text Status: None
Date Deposited: 08 Jun 2004 09:02
URI: http://kups.ub.uni-koeln.de/id/eprint/1093

Downloads

Downloads per month over past year

Export

Actions (login required)

View Item View Item