Flatten, Tim (2020). Direct measurement of anisotropic resistivity in thin films using a 4-probe STM. Thesis Abstract, Universität zu Köln.
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| Item Type: | Thesis Abstract |
| Translated title: | Title Language Direkte Messung anisotroper Leitfähigkeiten auf dünnen Filmen mit Hilfe eines 4-Spitzen STM German |
| Creators: | Creators Email ORCID ORCID Put Code Flatten, Tim tim.flatten@t-online.de UNSPECIFIED UNSPECIFIED |
| URN: | urn:nbn:de:hbz:38-116031 |
| Series Name: | Schriften des Forschungszentrums Jülich. Reihe Schlüsseltechnologien |
| Volume: | 213 |
| Date: | 2020 |
| Publisher: | Forschungszentrum Jülich |
| Place of Publication: | Jülich |
| ISSN: | 1866-1807 |
| ISBN: | 978-3-95806-460-7 |
| Language: | English |
| Faculty: | Faculty of Mathematics and Natural Sciences |
| Divisions: | Außeruniversitäre Forschungseinrichtungen > Forschungszentrum Jülich |
| Subjects: | Physics |
| Uncontrolled Keywords: | Keywords Language 4-probe transport measurements UNSPECIFIED layered materials UNSPECIFIED anisotropic resistivity/conductivity UNSPECIFIED |
| Date of oral exam: | 4 February 2020 |
| Referee: | Name Academic Title Bürgler, Daniel E. PD Dr. Michely, Thomas Prof. Dr. |
| Refereed: | Yes |
| URI: | http://kups.ub.uni-koeln.de/id/eprint/11603 |
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