Limböck, Thorsten Simon (2020). Investigation and Tuning of Organic Thin Films by Methods of Atomic Force Microscopy. Thesis Abstract, Universität zu Köln.

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Item Type: Thesis Abstract
Translated title:
TitleLanguage
UNSPECIFIEDGerman
Creators:
CreatorsEmailORCIDORCID Put Code
Limböck, Thorsten SimonUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
URN: urn:nbn:de:hbz:38-121341
Date: 14 September 2020
Language: English
Faculty: Faculty of Mathematics and Natural Sciences
Divisions: Faculty of Mathematics and Natural Sciences > Department of Chemistry > Institute of Physical Chemistry
Subjects: Natural sciences and mathematics
Physics
Chemistry and allied sciences
Uncontrolled Keywords:
KeywordsLanguage
Atomic Force Microscopy; Thin Films; Organic ElectronicsEnglish
Date of oral exam: 20 September 2019
Referee:
NameAcademic Title
Meerholz, KlausProf. Dr.
Michely, ThomasProf. Dr.
Refereed: Yes
URI: http://kups.ub.uni-koeln.de/id/eprint/12134

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