Limböck, Thorsten Simon (2020). Investigation and Tuning of Organic Thin Films by Methods of Atomic Force Microscopy. Thesis Abstract, Universität zu Köln.
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| Item Type: | Thesis Abstract |
| Translated title: | Title Language UNSPECIFIED German |
| Creators: | Creators Email ORCID ORCID Put Code Limböck, Thorsten Simon UNSPECIFIED UNSPECIFIED UNSPECIFIED |
| URN: | urn:nbn:de:hbz:38-121341 |
| Date: | 14 September 2020 |
| Language: | English |
| Faculty: | Faculty of Mathematics and Natural Sciences |
| Divisions: | Faculty of Mathematics and Natural Sciences > Department of Chemistry > Institute of Physical Chemistry |
| Subjects: | Natural sciences and mathematics Physics Chemistry and allied sciences |
| Uncontrolled Keywords: | Keywords Language Atomic Force Microscopy; Thin Films; Organic Electronics English |
| Date of oral exam: | 20 September 2019 |
| Referee: | Name Academic Title Meerholz, Klaus Prof. Dr. Michely, Thomas Prof. Dr. |
| Refereed: | Yes |
| URI: | http://kups.ub.uni-koeln.de/id/eprint/12134 |
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