Rheinlaender, Johannes ORCID: 0000-0002-1976-9245, Dimitracopoulos, Andrea, Wallmeyer, Bernhard, Kronenberg, Nils M., Chalut, Kevin J., Gather, Malte C. ORCID: 0000-0002-4857-5562, Betz, Timo ORCID: 0000-0002-1548-0655, Charras, Guillaume ORCID: 0000-0002-7902-0279 and Franze, Kristian ORCID: 0000-0002-8425-7297 . Cortical cell stiffness is independent of substrate mechanics. Nat. Mater.. LONDON: NATURE PUBLISHING GROUP. ISSN 1476-4660

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Abstract

Atomic force microscopy indentation measurements of cells cultured on soft substrates may result in an underestimation of cell stiffness. A model has now been developed that takes this soft substrate effect into account, revealing that cortical cell stiffness is largely independent of substrate mechanics. Cortical stiffness is an important cellular property that changes during migration, adhesion and growth. Previous atomic force microscopy (AFM) indentation measurements of cells cultured on deformable substrates have suggested that cells adapt their stiffness to that of their surroundings. Here we show that the force applied by AFM to a cell results in a significant deformation of the underlying substrate if this substrate is softer than the cell. This 'soft substrate effect' leads to an underestimation of a cell's elastic modulus when analysing data using a standard Hertz model, as confirmed by finite element modelling and AFM measurements of calibrated polyacrylamide beads, microglial cells and fibroblasts. To account for this substrate deformation, we developed a 'composite cell-substrate model'. Correcting for the substrate indentation revealed that cortical cell stiffness is largely independent of substrate mechanics, which has major implications for our interpretation of many physiological and pathological processes.

Item Type: Journal Article
Creators:
CreatorsEmailORCIDORCID Put Code
Rheinlaender, JohannesUNSPECIFIEDorcid.org/0000-0002-1976-9245UNSPECIFIED
Dimitracopoulos, AndreaUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Wallmeyer, BernhardUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Kronenberg, Nils M.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Chalut, Kevin J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Gather, Malte C.UNSPECIFIEDorcid.org/0000-0002-4857-5562UNSPECIFIED
Betz, TimoUNSPECIFIEDorcid.org/0000-0002-1548-0655UNSPECIFIED
Charras, GuillaumeUNSPECIFIEDorcid.org/0000-0002-7902-0279UNSPECIFIED
Franze, KristianUNSPECIFIEDorcid.org/0000-0002-8425-7297UNSPECIFIED
URN: urn:nbn:de:hbz:38-332967
DOI: 10.1038/s41563-020-0684-x
Journal or Publication Title: Nat. Mater.
Publisher: NATURE PUBLISHING GROUP
Place of Publication: LONDON
ISSN: 1476-4660
Language: English
Faculty: Faculty of Mathematics and Natural Sciences
Divisions: Faculty of Mathematics and Natural Sciences > Department of Chemistry > Institute of Physical Chemistry
Subjects: no entry
Uncontrolled Keywords:
KeywordsLanguage
ATOMIC-FORCE MICROSCOPY; ELASTIC-MODULI; SOFT; PRECISION; MIGRATIONMultiple languages
Chemistry, Physical; Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed MatterMultiple languages
Refereed: Yes
URI: http://kups.ub.uni-koeln.de/id/eprint/33296

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