Wahl, Ulrich ORCID: 0000-0001-7398-2904, Correia, Joao Guilherme, Costa, Angelo R. G., David-Bosne, Eric, Kappers, Menno J., da Silva, Manuel Ribeiro, Lippertz, Gertjan ORCID: 0000-0002-4061-7027, Lima, Tiago A. L., Villarreal, Renan, Vantomme, Andre ORCID: 0000-0001-9158-6534 and Pereira, Lino M. C. (2021). Lattice Location Studies of the Amphoteric Nature of Implanted Mg in GaN. Adv. Electron. Mater., 7 (9). HOBOKEN: WILEY. ISSN 2199-160X

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Abstract

Despite the renewed interest in ion implantation doping of GaN, efficient electrical activation remains a challenge. The lattice location of Mg-27 is investigated in GaN of different doping types as a function of implantation temperature and fluence at CERN's ISOLDE facility. The amphoteric nature of Mg is elucidated, i.e., the concurrent occupation of substitutional Ga and interstitial sites: following room temperature ultra-low fluence (approximate to 2 x 10(10) cm(-2)) implantation, the interstitial fraction of Mg is highest (20-24%) in GaN pre-doped with stable Mg during growth, and lowest (2-6%) in n-GaN:Si, while undoped GaN shows an intermediate interstitial fraction of 10-12%. Both for p- and n-GaN prolonged implantations cause interstitial Mg-27 to approach the levels found for undoped GaN. Implanting above 400 degrees C progressively converts interstitial Mg to substitutional Ga sites due to the onset of Mg interstitial migration (estimated activation energy 1.5-2.3 eV) and combination with Ga vacancies. In all sample types, implantations above a fluence of 10(14) cm(-2) result in >95% substitutional Mg. Ion implantation is hence a very efficient method to introduce Mg into substitutional Ga sites, i.e., challenges toward high electrical activation of implanted Mg are not related to lack of substitutional incorporation.

Item Type: Journal Article
Creators:
CreatorsEmailORCIDORCID Put Code
Wahl, UlrichUNSPECIFIEDorcid.org/0000-0001-7398-2904UNSPECIFIED
Correia, Joao GuilhermeUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Costa, Angelo R. G.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
David-Bosne, EricUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Kappers, Menno J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
da Silva, Manuel RibeiroUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lippertz, GertjanUNSPECIFIEDorcid.org/0000-0002-4061-7027UNSPECIFIED
Lima, Tiago A. L.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Villarreal, RenanUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Vantomme, AndreUNSPECIFIEDorcid.org/0000-0001-9158-6534UNSPECIFIED
Pereira, Lino M. C.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
URN: urn:nbn:de:hbz:38-592278
DOI: 10.1002/aelm.202100345
Journal or Publication Title: Adv. Electron. Mater.
Volume: 7
Number: 9
Date: 2021
Publisher: WILEY
Place of Publication: HOBOKEN
ISSN: 2199-160X
Language: English
Faculty: Unspecified
Divisions: Unspecified
Subjects: no entry
Uncontrolled Keywords:
KeywordsLanguage
MAGNESIUM-ION-IMPLANTATION; GALLIUM NITRIDE; DEFECTS; TOOLMultiple languages
Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, AppliedMultiple languages
URI: http://kups.ub.uni-koeln.de/id/eprint/59227

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