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Krause, J., Dickel, C., Vaal, E., Vielmetter, M., Feng, J., Bounds, R., Catelani, G., Fink, J. M. and Ando, Yoichi 
ORCID: 0000-0002-3553-3355
(2022).
Magnetic Field Resilience of Three-Dimensional Transmons with Thin-Film Al/AlOx/Al Josephson Junctions Approaching 1 T.
Phys. Rev. Appl., 17 (3).
COLLEGE PK:
AMER PHYSICAL SOC.
ISSN 2331-7019