 | Up a level |
Number of items: 1.
Meunier, V., Löhnert, U. 
ORCID: 0000-0002-9023-0269, Kollias, P. and Crewell, S. ORCID: 0000-0003-1251-5805
(2013).
Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers.
Atmospheric Measurement Techniques, 6 (5).
pp. 1171-1187.
European Geosciences Union.
ISSN 1867-8548