Flatten, Tim (2020). Direct measurement of anisotropic resistivity in thin films using a 4-probe STM. Thesis Abstract, Universität zu Köln.
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Item Type: | Thesis Abstract | ||||||||
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URN: | urn:nbn:de:hbz:38-116031 | ||||||||
Series Name: | Schriften des Forschungszentrums Jülich. Reihe Schlüsseltechnologien | ||||||||
Volume: | 213 | ||||||||
Date: | 2020 | ||||||||
Publisher: | Forschungszentrum Jülich | ||||||||
Place of Publication: | Jülich | ||||||||
ISSN: | 1866-1807 | ||||||||
ISBN: | 978-3-95806-460-7 | ||||||||
Language: | English | ||||||||
Faculty: | Faculty of Mathematics and Natural Sciences | ||||||||
Divisions: | Außeruniversitäre Forschungseinrichtungen > Forschungszentrum Jülich | ||||||||
Subjects: | Physics | ||||||||
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Date of oral exam: | 4 February 2020 | ||||||||
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Refereed: | Yes | ||||||||
URI: | http://kups.ub.uni-koeln.de/id/eprint/11603 |
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