Flatten, Tim (2020). Direct measurement of anisotropic resistivity in thin films using a 4-probe STM. Thesis Abstract, Universität zu Köln.

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Item Type: Thesis Abstract
Translated title:
Title
Language
Direkte Messung anisotroper Leitfähigkeiten auf dünnen Filmen mit Hilfe eines 4-Spitzen STM
German
Creators:
Creators
Email
ORCID
ORCID Put Code
Flatten, Tim
tim.flatten@t-online.de
UNSPECIFIED
UNSPECIFIED
URN: urn:nbn:de:hbz:38-116031
Series Name: Schriften des Forschungszentrums Jülich. Reihe Schlüsseltechnologien
Volume: 213
Date: 2020
Publisher: Forschungszentrum Jülich
Place of Publication: Jülich
ISSN: 1866-1807
ISBN: 978-3-95806-460-7
Language: English
Faculty: Faculty of Mathematics and Natural Sciences
Divisions: Außeruniversitäre Forschungseinrichtungen > Forschungszentrum Jülich
Subjects: Physics
Uncontrolled Keywords:
Keywords
Language
4-probe transport measurements
UNSPECIFIED
layered materials
UNSPECIFIED
anisotropic resistivity/conductivity
UNSPECIFIED
Date of oral exam: 4 February 2020
Referee:
Name
Academic Title
Bürgler, Daniel E.
PD Dr.
Michely, Thomas
Prof. Dr.
Refereed: Yes
URI: http://kups.ub.uni-koeln.de/id/eprint/11603

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