Universität zu Köln

Weinen, J., Koethe, T. C., Chang, C. F., Agrestini, S., Kasinathan, D., Liao, Y. F., Fujiwara, H., Schussler-Langeheine, C., Strigari, F., Haupricht, T., Panaccione, G., Offi, F., Monaco, G., Huotari, S., Tsuei, K-D. and Tjeng, L. H. (2015). Polarization dependent hard X-ray photoemission experiments for solids: Efficiency and limits for unraveling the orbital character of the valence band. J. Electron Spectrosc. Relat. Phenom., 198. S. 6 - 12. AMSTERDAM: ELSEVIER. ISSN 1873-2526

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Abstract

We have investigated the efficiency and limits of polarization dependent hard X-ray photoelectron spectroscopy (HAXPES) in order to establish how well this method can be used to unravel quantitatively the contributions of the orbitals forming the valence band of solids. By rotating the energy analyzer rather than the polarization vector of the light using a phase retarder, we obtained the advantage that the full polarization of the light is available for the investigation. Using NiO, ZnO, and Cu2O as examples for solid state materials, we established that the polarization dependence is much larger than in photoemission experiments utilizing ultra-violet or soft X-ray light. Yet we also have discovered that the polarization dependence is less than complete on the basis of atomic calculations, strongly suggesting that the trajectories of the outgoing electrons are affected by appreciable side-scattering processes even at these high kinetic energies. We have found in our experiment that these can be effectively described as a directional spread of +/- 18 degrees of the photoelectrons. This knowledge allows us to identify, for example, reliably the Ni 3d spectral weight of the NiO valence band and at the same time to demonstrate the importance of the Ni 4s for the chemical stability of the compound. (C) 2014 Elsevier B.V. All rights reserved.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Weinen, J. UNSPECIFIED UNSPECIFIED UNSPECIFIED Koethe, T. C. UNSPECIFIED UNSPECIFIED UNSPECIFIED Chang, C. F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Agrestini, S. UNSPECIFIED UNSPECIFIED UNSPECIFIED Kasinathan, D. UNSPECIFIED UNSPECIFIED UNSPECIFIED Liao, Y. F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Fujiwara, H. UNSPECIFIED UNSPECIFIED UNSPECIFIED Schussler-Langeheine, C. UNSPECIFIED UNSPECIFIED UNSPECIFIED Strigari, F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Haupricht, T. UNSPECIFIED UNSPECIFIED UNSPECIFIED Panaccione, G. UNSPECIFIED UNSPECIFIED UNSPECIFIED Offi, F. UNSPECIFIED UNSPECIFIED UNSPECIFIED Monaco, G. UNSPECIFIED UNSPECIFIED UNSPECIFIED Huotari, S. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tsuei, K-D. UNSPECIFIED UNSPECIFIED UNSPECIFIED Tjeng, L. H. UNSPECIFIED UNSPECIFIED UNSPECIFIED
URN:	urn:nbn:de:hbz:38-419167
DOI:	10.1016/j.elspec.2014.11.003
Journal or Publication Title:	J. Electron Spectrosc. Relat. Phenom.
Volume:	198
Page Range:	S. 6 - 12
Date:	2015
Publisher:	ELSEVIER
Place of Publication:	AMSTERDAM
ISSN:	1873-2526
Language:	English
Faculty:	Unspecified
Divisions:	Unspecified
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language PHOTOELECTRON ANGULAR-DISTRIBUTION; BULK ELECTRONIC-STRUCTURE; HIGH-ENERGY PHOTOEMISSION; RESOLUTION; PARAMETERS; SPECTRA; NIO Multiple languages Spectroscopy Multiple languages
URI:	http://kups.ub.uni-koeln.de/id/eprint/41916