Universität zu Köln

Pierret, A., Mele, D., Graef, H., Palomo, J., Taniguchi, T., Watanabe, K., Li, Y., Toury, B., Journet, C., Steyer, P., Garnier, V, Loiseau, A., Berroir, J-M, Bocquillon, E., Feve, G., Voisin, C., Baudin, E., Rosticher, M. and Placais, B. (2022). Dielectric permittivity, conductivity and breakdown field of hexagonal boron nitride. Mater. Res. Express, 9 (6). BRISTOL: IOP Publishing Ltd. ISSN 2053-1591

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Abstract

In view of the extensive use of hexagonal boron nitride (hBN) in 2D material electronics, it becomes important to refine its dielectric characterization in terms of low-field permittivity and high-field strength and conductivity up to the breakdown voltage. The present study aims at filling this gap using DC and RF transport in two Au-hBN-Au capacitor series of variable thickness in the 10-100 nm range, made of large high-pressure, high-temperature (HPHT) crystals and a polymer derivative ceramics (PDC) crystals. We deduce an out-of-plane low field dielectric constant epsilon (parallel to) = 3.4 +/- 0.2 consistent with the theoretical prediction of Ohba et al, that narrows down the generally accepted window epsilon (parallel to) = 3-4. The DC-current leakage at high-field is found to obey the Frenkel-Pool law for thermally-activated trap-assisted electron transport with a dynamic dielectric constant epsilon (parallel to) similar or equal to 3.1 and a trap energy phi( B ) similar or equal to 1.3 eV, that is comparable with standard technologically relevant dielectrics.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Pierret, A. UNSPECIFIED UNSPECIFIED UNSPECIFIED Mele, D. UNSPECIFIED UNSPECIFIED UNSPECIFIED Graef, H. UNSPECIFIED UNSPECIFIED UNSPECIFIED Palomo, J. UNSPECIFIED UNSPECIFIED UNSPECIFIED Taniguchi, T. UNSPECIFIED UNSPECIFIED UNSPECIFIED Watanabe, K. UNSPECIFIED UNSPECIFIED UNSPECIFIED Li, Y. UNSPECIFIED UNSPECIFIED UNSPECIFIED Toury, B. UNSPECIFIED UNSPECIFIED UNSPECIFIED Journet, C. UNSPECIFIED UNSPECIFIED UNSPECIFIED Steyer, P. UNSPECIFIED UNSPECIFIED UNSPECIFIED Garnier, V UNSPECIFIED UNSPECIFIED UNSPECIFIED Loiseau, A. UNSPECIFIED UNSPECIFIED UNSPECIFIED Berroir, J-M UNSPECIFIED UNSPECIFIED UNSPECIFIED Bocquillon, E. UNSPECIFIED UNSPECIFIED UNSPECIFIED Feve, G. UNSPECIFIED UNSPECIFIED UNSPECIFIED Voisin, C. UNSPECIFIED UNSPECIFIED UNSPECIFIED Baudin, E. UNSPECIFIED UNSPECIFIED UNSPECIFIED Rosticher, M. UNSPECIFIED UNSPECIFIED UNSPECIFIED Placais, B. UNSPECIFIED UNSPECIFIED UNSPECIFIED
URN:	urn:nbn:de:hbz:38-691942
DOI:	10.1088/2053-1591/ac4fe1
Journal or Publication Title:	Mater. Res. Express
Volume:	9
Number:	6
Date:	2022
Publisher:	IOP Publishing Ltd
Place of Publication:	BRISTOL
ISSN:	2053-1591
Language:	English
Faculty:	Unspecified
Divisions:	Unspecified
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language SINGLE-CRYSTALS; GRAPHENE; TRANSPORT; STRENGTH Multiple languages Materials Science, Multidisciplinary Multiple languages
URI:	http://kups.ub.uni-koeln.de/id/eprint/69194