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Engler, Martin 
ORCID: 0000-0002-6593-0677 and Michely, Thomas
(2016).
Amorphous to crystalline phase transition: Onset of pattern formation during ion erosion of Si(001).
Phys. Rev. B, 93 (8).
COLLEGE PK:
AMER PHYSICAL SOC.
ISSN 2469-9969
Engler, Martin ORCID: 0000-0002-6593-0677, Macko, Sven, Frost, Frank and Michely, Thomas
(2014).
Evolution of ion beam induced patterns on Si(001).
Phys. Rev. B, 89 (24).
COLLEGE PK:
AMER PHYSICAL SOC.
ISSN 1550-235X
Engler, Martin ORCID: 0000-0002-6593-0677, Frost, Frank, Mueller, Sven, Macko, Sven, Will, Moritz, Feder, Rene ORCID: 0000-0002-5694-5332, Spemann, Daniel, Huebner, Rene, Facsko, Stefan ORCID: 0000-0003-3698-3793 and Michely, Thomas
(2014).
Silicide induced ion beam patterning of Si(001).
Nanotechnology, 25 (11).
BRISTOL:
IOP PUBLISHING LTD.
ISSN 1361-6528
Vivo, Edoardo, Nicoli, Matteo, Engler, Martin ORCID: 0000-0002-6593-0677, Michely, Thomas, Vazquez, Luis and Cuerno, Rodolfo ORCID: 0000-0002-3563-771X
(2012).
Strong anisotropy in surface kinetic roughening: Analysis and experiments.
Phys. Rev. B, 86 (24).
COLLEGE PK:
AMER PHYSICAL SOC.
ISSN 2469-9969