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Kaya, L., Vogt, A., Reiter, P., Birkenbach, B., Hirsch, R., Arnswald, K., Hess, H., Seidlitz, M., Steinbach, T., Warr, N., Wolf, K., Stahl, C., Pietralla, N., Limboeck, T., Meerholz, K. and Lutter, R. (2017). Characterization and calibration of radiation-damaged double-sided silicon strip detectors. Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc. Equip., 855. S. 109 - 118. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1872-9576