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Journal Article

Kaya, L., Vogt, A., Reiter, P., Birkenbach, B., Hirsch, R., Arnswald, K., Hess, H., Seidlitz, M., Steinbach, T., Warr, N., Wolf, K., Stahl, C., Pietralla, N., Limboeck, T., Meerholz, K. and Lutter, R. (2017). Characterization and calibration of radiation-damaged double-sided silicon strip detectors. Nucl. Instrum. Methods Phys. Res. Sect. A-Accel. Spectrom. Dect. Assoc. Equip., 855. S. 109 - 118. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1872-9576

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