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Number of items: 5.

Journal Article

Chang, C. F., Koethe, T. C., Hu, Z., Weinen, J., Agrestini, S., Zhao, L., Gegner, J., Ott, H., Panaccione, G., Wu, Hua ORCID: 0000-0003-1280-202X, Haverkort, M. W., Roth, H., Komarek, A. C., Offi, F., Monaco, G., Liao, Y. -F., Tsuei, K. -D., Lin, H. -J., Chen, C. T., Tanaka, A. and Tjeng, L. H. (2018). c-Axis Dimer and Its Electronic Breakup: The Insulator-to-Metal Transition in Ti2O3. Phys. Rev. X, 8 (2). COLLEGE PK: AMER PHYSICAL SOC. ISSN 2160-3308

Gannon, W. J., Chen, K., Sundermann, M., Strigari, F., Utsumi, Y., Tsuei, K. -D., Rueff, J. -P., Bencok, P., Tanaka, A., Severing, A. and Aronson, M. C. (2018). Intermediate valence in single crystalline Yb2Si2Al. Phys. Rev. B, 98 (7). COLLEGE PK: AMER PHYSICAL SOC. ISSN 2469-9969

Kuo, C. -Y., Haupricht, T., Weinen, J., Wu, Hua ORCID: 0000-0003-1280-202X, Tsuei, K. -D., Haverkort, M. W., Tanaka, A. and Tjeng, L. H. (2017). Challenges from experiment: electronic structure of NiO. Eur. Phys. J.-Spec. Top., 226 (11). S. 2445 - 2457. HEIDELBERG: SPRINGER HEIDELBERG. ISSN 1951-6401

Strigari, F., Sundermann, M., Muro, Y., Yutani, K., Takabatake, T., Tsuei, K. -D., Liao, Y. F., Tanaka, A., Thalmeier, P., Haverkort, M. W., Tjeng, L. H. and Severing, A. (2015). Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (M = Ru, Os and Fe) by means of bulk-sensitive hard X-ray photoelectron spectroscopy. J. Electron Spectrosc. Relat. Phenom., 199. S. 56 - 64. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1873-2526

Sundermann, M., Strigari, F., Willers, T., Weinen, J., Liao, Y. F., Tsuei, K. -D., Hiraoka, N., Ishii, H., Yamaoka, H., Mizuki, J., Zekko, Y., Bauer, E. D., Sarrao, J. L., Thompson, J. D., Lejay, P., Muro, Y., Yutani, K., Takabatake, T., Tanaka, A., Hollmann, N., Tjeng, L. H. and Severing, A. (2016). Quantitative study of the f occupation in CeMIn5 and other cerium compounds with hard X-rays. J. Electron Spectrosc. Relat. Phenom., 209. S. 1 - 9. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1873-2526

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