Universität zu Köln

Kwon, Owoong, Seol, Daehee, Lee, Dongkyu, Han, Hee, Lindfors-Vrejoiu, Ionela ORCID: 0000-0003-3196-7313, Lee, Woo, Jesse, Stephen, Lee, Ho Nyung ORCID: 0000-0002-2180-3975, Kalinin, Sergei V., Alexe, Marin ORCID: 0000-0002-0386-3026 and Kim, Yunseok (2018). Direct Probing of Polarization Charge at Nanoscale Level. Adv. Mater., 30 (1). WEINHEIM: WILEY-V C H VERLAG GMBH. ISSN 1521-4095

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Abstract

Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long-term development of reducing the sizes of devices, the preparation of ferroelectric materials and devices is entering the nanometer-scale regime. Accordingly, to evaluate the ferroelectricity, there is a need to investigate the polarization charge at the nanoscale. Nonetheless, it is generally accepted that the detection of polarization charges using a conventional conductive atomic force microscopy (CAFM) without a top electrode is not feasible because the nanometer-scale radius of an atomic force microscopy (AFM) tip yields a very low signal-to-noise ratio. However, the detection is unrelated to the radius of an AFM tip and, in fact, a matter of the switched area. In this work, the direct probing of the polarization charge at the nanoscale is demonstrated using the positive-up-negative-down method based on the conventional CAFM approach without additional corrections or circuits to reduce the parasitic capacitance. The polarization charge densities of 73.7 and 119.0 mu C cm(-2) are successfully probed in ferroelectric nanocapacitors and thin films, respectively. The obtained results show the feasibility of the evaluation of polarization charge at the nanoscale and provide a new guideline for evaluating the ferroelectricity at the nanoscale.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Kwon, Owoong UNSPECIFIED UNSPECIFIED UNSPECIFIED Seol, Daehee UNSPECIFIED UNSPECIFIED UNSPECIFIED Lee, Dongkyu UNSPECIFIED UNSPECIFIED UNSPECIFIED Han, Hee UNSPECIFIED UNSPECIFIED UNSPECIFIED Lindfors-Vrejoiu, Ionela UNSPECIFIED orcid.org/0000-0003-3196-7313 UNSPECIFIED Lee, Woo UNSPECIFIED UNSPECIFIED UNSPECIFIED Jesse, Stephen UNSPECIFIED UNSPECIFIED UNSPECIFIED Lee, Ho Nyung UNSPECIFIED orcid.org/0000-0002-2180-3975 UNSPECIFIED Kalinin, Sergei V. UNSPECIFIED UNSPECIFIED UNSPECIFIED Alexe, Marin UNSPECIFIED orcid.org/0000-0002-0386-3026 UNSPECIFIED Kim, Yunseok UNSPECIFIED UNSPECIFIED UNSPECIFIED
URN:	urn:nbn:de:hbz:38-199159
DOI:	10.1002/adma.201703675
Journal or Publication Title:	Adv. Mater.
Volume:	30
Number:	1
Date:	2018
Publisher:	WILEY-V C H VERLAG GMBH
Place of Publication:	WEINHEIM
ISSN:	1521-4095
Language:	English
Faculty:	Faculty of Mathematics and Natural Sciences
Divisions:	Faculty of Mathematics and Natural Sciences > Department of Physics > Institute of Physics II
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language FREQUENCY-DEPENDENCE; COERCIVE FIELD; HYSTERESIS; FERROELECTRICITY; CAPACITORS; TITANATE; FILMS Multiple languages Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter Multiple languages
Refereed:	Yes
URI:	http://kups.ub.uni-koeln.de/id/eprint/19915