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Journal Article
Chang, C. F., Koethe, T. C., Hu, Z., Weinen, J., Agrestini, S., Zhao, L., Gegner, J., Ott, H., Panaccione, G., Wu, Hua 
ORCID: 0000-0003-1280-202X, Haverkort, M. W., Roth, H., Komarek, A. C., Offi, F., Monaco, G., Liao, Y. -F., Tsuei, K. -D., Lin, H. -J., Chen, C. T., Tanaka, A. and Tjeng, L. H.
(2018).
c-Axis Dimer and Its Electronic Breakup: The Insulator-to-Metal Transition in Ti2O3.
Phys. Rev. X, 8 (2).
COLLEGE PK:
AMER PHYSICAL SOC.
ISSN 2160-3308
Chin, Y. Y., Hu, Z., Lin, H-J, Agrestini, S., Weinen, J., Martin, C., Hebert, S., Maignan, A., Tanaka, A., Cezar, J. C., Brookes, N. B., Liao, Y-F, Tsuei, K-D, Chen, C. T., Khomskii, D., I and Tjeng, L. H. (2019). Spin-orbit coupling and crystal-field distortions for a low-spin 3d(5) state in BaCoO3. Phys. Rev. B, 100 (20). COLLEGE PK: AMER PHYSICAL SOC. ISSN 2469-9969
Kuo, C. -Y., Haupricht, T., Weinen, J., Wu, Hua ORCID: 0000-0003-1280-202X, Tsuei, K. -D., Haverkort, M. W., Tanaka, A. and Tjeng, L. H.
(2017).
Challenges from experiment: electronic structure of NiO.
Eur. Phys. J.-Spec. Top., 226 (11).
S. 2445 - 2457.
HEIDELBERG:
SPRINGER HEIDELBERG.
ISSN 1951-6401
Sundermann, M., Strigari, F., Willers, T., Weinen, J., Liao, Y. F., Tsuei, K. -D., Hiraoka, N., Ishii, H., Yamaoka, H., Mizuki, J., Zekko, Y., Bauer, E. D., Sarrao, J. L., Thompson, J. D., Lejay, P., Muro, Y., Yutani, K., Takabatake, T., Tanaka, A., Hollmann, N., Tjeng, L. H. and Severing, A. (2016). Quantitative study of the f occupation in CeMIn5 and other cerium compounds with hard X-rays. J. Electron Spectrosc. Relat. Phenom., 209. S. 1 - 9. AMSTERDAM: ELSEVIER SCIENCE BV. ISSN 1873-2526
Weinen, J., Koethe, T. C., Chang, C. F., Agrestini, S., Kasinathan, D., Liao, Y. F., Fujiwara, H., Schussler-Langeheine, C., Strigari, F., Haupricht, T., Panaccione, G., Offi, F., Monaco, G., Huotari, S., Tsuei, K-D. and Tjeng, L. H. (2015). Polarization dependent hard X-ray photoemission experiments for solids: Efficiency and limits for unraveling the orbital character of the valence band. J. Electron Spectrosc. Relat. Phenom., 198. S. 6 - 12. AMSTERDAM: ELSEVIER. ISSN 1873-2526