Universität zu Köln

Alyabyeva, Natalia ORCID: 0000-0001-5999-5821, Ouvrard, Aimeric ORCID: 0000-0003-3652-1222, Lindfors-Vrejoiu, Ionela ORCID: 0000-0003-3196-7313, Kolomiytsev, Alexey ORCID: 0000-0001-7483-0240, Solodovnik, Maxim ORCID: 0000-0002-0557-5909, Ageev, Oleg and McGrouther, Damien (2018). Modified cantilevers to probe unambiguously out-of-plane piezoresponse. Phys. Rev. Mater., 2 (6). COLLEGE PK: AMER PHYSICAL SOC. ISSN 2475-9953

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Abstract

We demonstrate and investigate the coupling of contributions from both in-plane (IP) polarization and out-of-plane (OP) components in BiFeO3 (BFO) thin-film polarization probed by piezoresponse force microscopy (PFM). Such coupling leads to image artifacts which prevent the correct determination of OP polarization vector directions and the corresponding piezoelectric coefficient d(33). Using material strength theory with a one-dimensional modeling of the cantilever oscillation amplitude under electrostatic and elastic forces as a function of the tip length, we have evidenced the impact of IP piezoresponse to the OP signal for tip length longer than 4 mu m. The IP polarization vector induces a significant longitudinal bending of the cantilever, due to the small spring constant of long tips, which provokes a normal deviation superimposed to the OP piezoresponse. These artifacts can be reduced by increasing the longitudinal spring constant of the cantilever by shortening the tip length. Standard cantilevers with 15-mu m-long tips were modified to reach the desired tip length, using focused ion-beam techniques and tested using PFM on the same BFO thin film. Tip length shortening has strongly reduced IP artifacts as expected, while the impact of nonlocal electrostatic forces, becoming predominant for tips shorter than 1 mu m, has led to a non-negligible deflection offset. For shorter tips, a strong electric field from a cantilever beam can induce polarization switching as observed for a 0.5-mu m-long tip. Tip length ranging from 1 to 4 mu m allowed minimizing both artifacts to probe unambiguously OP piezoresponse and quantify the d(33) piezoelectric coefficient.

Item Type:	Journal Article
Creators:	Creators Email ORCID ORCID Put Code Alyabyeva, Natalia UNSPECIFIED orcid.org/0000-0001-5999-5821 UNSPECIFIED Ouvrard, Aimeric UNSPECIFIED orcid.org/0000-0003-3652-1222 UNSPECIFIED Lindfors-Vrejoiu, Ionela UNSPECIFIED orcid.org/0000-0003-3196-7313 UNSPECIFIED Kolomiytsev, Alexey UNSPECIFIED orcid.org/0000-0001-7483-0240 UNSPECIFIED Solodovnik, Maxim UNSPECIFIED orcid.org/0000-0002-0557-5909 UNSPECIFIED Ageev, Oleg UNSPECIFIED UNSPECIFIED UNSPECIFIED McGrouther, Damien UNSPECIFIED UNSPECIFIED UNSPECIFIED
URN:	urn:nbn:de:hbz:38-183066
DOI:	10.1103/PhysRevMaterials.2.064402
Journal or Publication Title:	Phys. Rev. Mater.
Volume:	2
Number:	6
Date:	2018
Publisher:	AMER PHYSICAL SOC
Place of Publication:	COLLEGE PK
ISSN:	2475-9953
Language:	English
Faculty:	Faculty of Mathematics and Natural Sciences
Divisions:	Faculty of Mathematics and Natural Sciences > Department of Physics > Institute of Physics II
Subjects:	no entry
Uncontrolled Keywords:	Keywords Language FORCE MICROSCOPY; FILMS Multiple languages Materials Science, Multidisciplinary Multiple languages
Refereed:	Yes
URI:	http://kups.ub.uni-koeln.de/id/eprint/18306