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Journal Article

Alves, Hans, Unkelbach, Christian ORCID: 0000-0002-3793-6246, Burghardt, Juliane ORCID: 0000-0003-0690-0731, Koch, Alex S., Krueger, Tobias and Becker, Vaughn D. (2015). A density explanation of valence asymmetries in recognition memory. Mem. Cogn., 43 (6). S. 896 - 910. NEW YORK: SPRINGER. ISSN 1532-5946

Koch, Alex ORCID: 0000-0002-6267-8066, Alves, Hans, Krueger, Tobias and Unkelbach, Christian ORCID: 0000-0002-3793-6246 (2016). A General Valence Asymmetry in Similarity: Good Is More Alike Than Bad. J. Exp. Psychol.-Learn. Mem. Cogn., 42 (8). S. 1171 - 1193. WASHINGTON: AMER PSYCHOLOGICAL ASSOC. ISSN 1939-1285

Krueger, Tobias, Fiedler, Klaus, Koch, Alex Stefan and Alves, Hans (2014). Response Category Width as a Psychophysical Manifestation of Construal Level and Distance. Pers. Soc. Psychol. Bull., 40 (4). S. 501 - 513. THOUSAND OAKS: SAGE PUBLICATIONS INC. ISSN 1552-7433

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